Gespeichert in:
| Titel: | Random test generation for fault detection and diagnosis |
|---|---|
| Von: |
Deepak Kumar Goel
|
| Person: |
Goel, Deepak Kumar
Verfasser aut |
| Hauptverfasser: | |
| Format: | Mikrofilm Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
1978
|
| Ausgabe: | [Mikrofiche-Ausg.] |
| Beschreibung: | Syracuse, NY, Univ., Diss., 1978. -Mikrofiche-Ausg.: Ann Arbor, Mich. : Univ. Microfilms Internat. 3 Mikrofiches |
| Beschreibung: | VIII, 251 S. graph. Darst. |
Internformat
MARC
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| 008 | 061114s1978 xx d||| b|||| 00||| eng d | ||
| 035 | |a (OCoLC)634860875 | ||
| 035 | |a (DE-599)BVBBV021998745 | ||
| 040 | |a DE-604 |b ger | ||
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| 100 | 1 | |a Goel, Deepak Kumar |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Random test generation for fault detection and diagnosis |c Deepak Kumar Goel |
| 250 | |a [Mikrofiche-Ausg.] | ||
| 264 | 1 | |c 1978 | |
| 300 | |a VIII, 251 S. |b graph. Darst. | ||
| 337 | |b h |2 rdamedia | ||
| 338 | |b he |2 rdacarrier | ||
| 500 | |a Syracuse, NY, Univ., Diss., 1978. -Mikrofiche-Ausg.: Ann Arbor, Mich. : Univ. Microfilms Internat. 3 Mikrofiches | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-015213362 | |
Datensatz im Suchindex
| _version_ | 1818963522721153024 |
|---|---|
| any_adam_object | |
| author | Goel, Deepak Kumar |
| author_facet | Goel, Deepak Kumar |
| author_role | aut |
| author_sort | Goel, Deepak Kumar |
| author_variant | d k g dk dkg |
| building | Verbundindex |
| bvnumber | BV021998745 |
| ctrlnum | (OCoLC)634860875 (DE-599)BVBBV021998745 |
| edition | [Mikrofiche-Ausg.] |
| format | Microfilm Book |
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| id | DE-604.BV021998745 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T12:46:34Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015213362 |
| oclc_num | 634860875 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | VIII, 251 S. graph. Darst. |
| publishDate | 1978 |
| publishDateSearch | 1978 |
| publishDateSort | 1978 |
| record_format | marc |
| spelling | Goel, Deepak Kumar Verfasser aut Random test generation for fault detection and diagnosis Deepak Kumar Goel [Mikrofiche-Ausg.] 1978 VIII, 251 S. graph. Darst. h rdamedia he rdacarrier Syracuse, NY, Univ., Diss., 1978. -Mikrofiche-Ausg.: Ann Arbor, Mich. : Univ. Microfilms Internat. 3 Mikrofiches |
| spellingShingle | Goel, Deepak Kumar Random test generation for fault detection and diagnosis |
| title | Random test generation for fault detection and diagnosis |
| title_auth | Random test generation for fault detection and diagnosis |
| title_exact_search | Random test generation for fault detection and diagnosis |
| title_full | Random test generation for fault detection and diagnosis Deepak Kumar Goel |
| title_fullStr | Random test generation for fault detection and diagnosis Deepak Kumar Goel |
| title_full_unstemmed | Random test generation for fault detection and diagnosis Deepak Kumar Goel |
| title_short | Random test generation for fault detection and diagnosis |
| title_sort | random test generation for fault detection and diagnosis |
| work_keys_str_mv | AT goeldeepakkumar randomtestgenerationforfaultdetectionanddiagnosis |