Gespeichert in:
| Titel: | IEEE Standard Atlas Test Language |
|---|---|
| Von: |
The Institute of Electrical and Electronics Engineers, Inc.
|
| Körperschaft: | |
| Format: | Buch |
| Sprache: | Nichtbestimmte Sprache |
| Veröffentlicht: |
New York
IEEE
1981
|
| Beschreibung: | Getr. Pag. |
| ISBN: | 0471862010 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV024522777 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t| | ||
| 008 | 090924s1981 xx |||| 00||| undod | ||
| 020 | |a 0471862010 |9 0-471-86201-0 | ||
| 035 | |a (OCoLC)916675813 | ||
| 035 | |a (DE-599)BVBBV024522777 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 110 | 2 | |a The Institute of Electrical and Electronics Engineers, Inc. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a IEEE Standard Atlas Test Language |c The Institute of Electrical and Electronics Engineers, Inc. |
| 264 | 1 | |a New York |b IEEE |c 1981 | |
| 300 | |a Getr. Pag. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 940 | 1 | |q TUB-nse | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-018496819 | |
Datensatz im Suchindex
| _version_ | 1818967968448512000 |
|---|---|
| any_adam_object | |
| author_corporate | The Institute of Electrical and Electronics Engineers, Inc |
| author_corporate_role | aut |
| author_facet | The Institute of Electrical and Electronics Engineers, Inc |
| author_sort | The Institute of Electrical and Electronics Engineers, Inc |
| building | Verbundindex |
| bvnumber | BV024522777 |
| ctrlnum | (OCoLC)916675813 (DE-599)BVBBV024522777 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00785nam a2200265 c 4500</leader><controlfield tag="001">BV024522777</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">090924s1981 xx |||| 00||| undod</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0471862010</subfield><subfield code="9">0-471-86201-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916675813</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024522777</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">The Institute of Electrical and Electronics Engineers, Inc.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">IEEE Standard Atlas Test Language</subfield><subfield code="c">The Institute of Electrical and Electronics Engineers, Inc.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">IEEE</subfield><subfield code="c">1981</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">Getr. Pag.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">TUB-nse</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018496819</subfield></datafield></record></collection> |
| id | DE-604.BV024522777 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T13:57:13Z |
| institution | BVB |
| isbn | 0471862010 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018496819 |
| oclc_num | 916675813 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | Getr. Pag. |
| psigel | TUB-nse |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | IEEE |
| record_format | marc |
| spelling | The Institute of Electrical and Electronics Engineers, Inc. Verfasser aut IEEE Standard Atlas Test Language The Institute of Electrical and Electronics Engineers, Inc. New York IEEE 1981 Getr. Pag. txt rdacontent n rdamedia nc rdacarrier |
| spellingShingle | IEEE Standard Atlas Test Language |
| title | IEEE Standard Atlas Test Language |
| title_auth | IEEE Standard Atlas Test Language |
| title_exact_search | IEEE Standard Atlas Test Language |
| title_full | IEEE Standard Atlas Test Language The Institute of Electrical and Electronics Engineers, Inc. |
| title_fullStr | IEEE Standard Atlas Test Language The Institute of Electrical and Electronics Engineers, Inc. |
| title_full_unstemmed | IEEE Standard Atlas Test Language The Institute of Electrical and Electronics Engineers, Inc. |
| title_short | IEEE Standard Atlas Test Language |
| title_sort | ieee standard atlas test language |
| work_keys_str_mv | AT theinstituteofelectricalandelectronicsengineersinc ieeestandardatlastestlanguage |