Gespeichert in:
| Titel: | Electromigration in ULSI interconnections |
|---|---|
| Von: |
Cher Ming Tan
|
| Person: |
Tan, Cher Ming
Verfasser aut |
| Hauptverfasser: | |
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
New Jersey [u.a.]
World Scientific
2010
|
| Schriftenreihe: | International series on advances in solid state electronics and technology
|
| Online-Zugang: | https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=731200 https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=731200 |
| Beschreibung: | Literaturangaben |
| Beschreibung: | 1 Online-Ressource (XIX, 291 S.) Ill., graph. Darst. |
| ISBN: | 9781283143714 |
Internformat
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Datensatz im Suchindex
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV040632522 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T16:19:16Z |
| institution | BVB |
| isbn | 9781283143714 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025459749 |
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| physical | 1 Online-Ressource (XIX, 291 S.) Ill., graph. Darst. |
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| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | World Scientific |
| record_format | marc |
| series2 | International series on advances in solid state electronics and technology |
| spellingShingle | Tan, Cher Ming Electromigration in ULSI interconnections |
| title | Electromigration in ULSI interconnections |
| title_auth | Electromigration in ULSI interconnections |
| title_exact_search | Electromigration in ULSI interconnections |
| title_full | Electromigration in ULSI interconnections Cher Ming Tan |
| title_fullStr | Electromigration in ULSI interconnections Cher Ming Tan |
| title_full_unstemmed | Electromigration in ULSI interconnections Cher Ming Tan |
| title_short | Electromigration in ULSI interconnections |
| title_sort | electromigration in ulsi interconnections |
| url | https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=731200 |
| work_keys_str_mv | AT tancherming electromigrationinulsiinterconnections |