Gespeichert in:
| Titel: | Machine vision automated visual inspection: theory, practice and applications |
|---|---|
| Von: |
Jürgen Beyerer ; Fernando Puente León ; Christian Frese
|
| Person: |
Beyerer, Jürgen
1961- Verfasser aut Puente León, Fernando Frese, Christian 1969-2020 1972- |
| Hauptverfassende: | , , |
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2016
|
| Schlagworte: | |
| Online-Zugang: | http://deposit.dnb.de/cgi-bin/dokserv?id=5282917&prov=M&dok_var=1&dok_ext=htm http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028601121&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| Beschreibung: | XX, 798 S. 235 mm x 155 mm |
| ISBN: | 9783662477939 3662477939 9783662477946 |
Internformat
MARC
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| 100 | 1 | |a Beyerer, Jürgen |d 1961- |e Verfasser |0 (DE-588)114116733 |4 aut | |
| 245 | 1 | 0 | |a Machine vision |b automated visual inspection: theory, practice and applications |c Jürgen Beyerer ; Fernando Puente León ; Christian Frese |
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 2016 | |
| 300 | |a XX, 798 S. |c 235 mm x 155 mm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Automatisches Prüfen |0 (DE-588)4269925-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Visuelle Prüfung |0 (DE-588)4188426-7 |2 gnd |9 rswk-swf |
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| 650 | 0 | 7 | |a Bildverarbeitung |0 (DE-588)4006684-8 |2 gnd |9 rswk-swf |
| 653 | |a UYT | ||
| 653 | |a Automated Visual Inspection | ||
| 653 | |a Image Processing | ||
| 653 | |a Optical Inspection | ||
| 653 | |a Quality Control | ||
| 653 | |a Optical Quality Inspection | ||
| 653 | |a Industrial Machine Vision | ||
| 653 | |a Image Evaluation | ||
| 653 | |a Optical Measuring | ||
| 689 | 0 | 0 | |a Maschinelles Sehen |0 (DE-588)4129594-8 |D s |
| 689 | 0 | 1 | |a Bildverarbeitung |0 (DE-588)4006684-8 |D s |
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| 689 | 0 | 3 | |a Automatisches Prüfen |0 (DE-588)4269925-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Puente León, Fernando |d 1969-2020 |e Verfasser |0 (DE-588)143524291 |4 aut | |
| 700 | 1 | |a Frese, Christian |d 1972- |e Verfasser |0 (DE-588)130396087 |4 aut | |
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Datensatz im Suchindex
| _version_ | 1819254783966445568 |
|---|---|
| adam_text | XI
CONTENTS
1 INTRODUCTION 1
1.1 VISUAL INSPECTION 3
1.2 OPTICAL CAPTURING OF TEST OBJECTS 7
1.3 FORMATION AND DEFINITION OF AN IMAGE 9
1.4 MACHINE VISION 10
1.5 PRACTICAL APPROACH FOR PERFORMING MACHINE VISION PROJECTS 15
1.6 BIBLIOGRAPHY 16
I IMAGE ACQUISITION 19
2 LIGHT 21
2.1 THE PHENOMENON OF LIGHT 23
2.1.1 THE ELECTROMAGNETIC SPECTRUM 23
2.2 LIGHT AS AN ELECTROMAGNETIC WAVE 24
2.2.1 MAXWELL S EQUATIONS 24
2.2.1.1 WAVE EQUATIONS OF THE ELECTRIC FIELD 26
2.2.2 POLARIZATION 31
2.2.2.1 THE POLARIZATION ELLIPSE 31
2.2.2.2 STOKES PARAMETERS 33
2.2.2.3 THE POINCARE SPHERE 35
2.2.2.4 MUELLER MATRICES 36
2.2.2.5 MEASURING THE POLARIZATION STATE 41
2.2.2.6 THE JONES CALCULUS 42
2.2.3 HUYGENS PRINCIPLE 44
2.2.4 COHERENCE 44
2.2.5 INTERFERENCE 46
2.2.6 DIFFRACTION 48
2.2.6.1 RESOLUTION OF IMAGING SYSTEMS 58
2.2.7 SPECKLE 60
2.3 LIGHT AS A QUANTUM PHENOMENON 61
2.4 THE RAY MODEL OF GEOMETRICAL OPTICS 65
2.5 SUMMARY 66
2.6 INTERACTION OF LIGHT AND MATTER 66
2.6.1 ABSORPTION 67
2.6.2 THE LAW OF REFLECTION 67
2.6.3 THE LAW OF REFRACTION 68
2.6.4 SCATTERING 70
2.6.5 THE FRESNEL COEFFICIENTS FOR REFLECTION AND TRANSMISSION 71
2.6.6 ELECTROMAGNETIC WAVES IN CONDUCTIVE MEDIA 76
2.6.6.1 COMPLEX INDEX OF REFRACTION 77
HTTP://D-NB.INFO/1071728458
XII CONTENTS
2.7 LIGHT SOURCES 80
2.7.1 THERMAL RADIATORS 80
2.7.1.1 PHYSICAL PRINCIPLES 80
2.7.1.2 INCANDESCENT LAMPS AND HALOGEN LAMPS 81
2.7.2 GAS-DISCHARGE LAMPS 83
2.7.3 LIGHT-EMITTING DIODES 86
2.7.4 LASER 89
2.7.5 SUMMARY 93
2.8 BIBLIOGRAPHY 93
3 OPTICAL IMAGING 97
3.1 INTRODUCTION 99
3.2 IMAGING WITH A PINHOLE CAMERA, CENTRAL PROJECTION 100
3.3 THE CAMERA MODEL AND CAMERA CALIBRATION 103
3.4 OPTICAL IMAGING USING A SINGLE LENS 106
3.4.1 THE PARAXIAL APPROXIMATION AND GAUSSIAN OPTICS 107
3.4.2 THIN LENS EQUATION 108
3.4.3 BUNDLE LIMITATION 114
3.4.4 DEPTH OF FIELD 117
3.4.5 TELECENTRIC IMAGING 123
3.4.5.1 DEFOCUSED TELECENTRIC IMAGING 124
3.4.5.2 DOUBLE-SIDED TELECENTRIC SYSTEMS 125
3.4.6 PERSPECTIVE 125
3.4.7 IMAGING OF TILTED PLANES 128
3.4.8 ABERRATIONS 133
3.4.8.1 SEIDEL ABERRATIONS OF SPHERICAL LENSES 133
3.4.8.2 CHROMATIC ABERRATION 136
3.5 OPTICAL INSTRUMENTS WITH SEVERAL LENSES 137
3.5.1 THE PROJECTOR 137
3.5.2 THE MICROSCOPE 138
3.6 BIBLIOGRAPHY 140
4 RADIOMETRY 143
4.1 RADIOMETRIC QUANTITIES 145
4.2 THE LIGHT FIELD OF A TEST OBJECT 150
4.3 THE BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION (BRDF) 152
4.3.1 BRDF AND SCATTERED LIGHT 155
4.4 FORMATION OF IMAGE VALUES 157
4.4.1 APPLICATION TO A THIN LENS 157
4.5 BIBLIOGRAPHY 160
5 COLOR 163
5.1 PHOTOMETRY 165
5.2 COLOR PERCEPTION AND COLOR SPACES 167
5.2.1 COLOR PERCEPTION OF THE HUMAN EYE 167
CONTENTS XIII
5.2.2 COLOR MIXING 171
5.2.3 CIE COLOR SPACES 173
5.2.4 SPECTROPHOTOMETRY FOR COLOR MEASUREMENT AND COLOR DISTANCE
COMPUTATION 185
5.2.5 COLOR ORDER SYSTEMS 191
5.2.6 OTHER COLOR SPACES 192
5.2.6.1 GAMMA CORRECTION 192
5.2.6.2 RGB COLOR SPACES 193
5.2.6.3 HSI AND HSV 195
5.2.6.4 YUV AND YC
B
C
R
196
5.2.6.5 COLOR PRINTING AND CMYK 197
5.3 FILTERS 198
5.4 ACQUISITION AND PROCESSING OF COLOR IMAGES 199
5.5 BIBLIOGRAPHY 201
6 SENSORS FOR IMAGE ACQUISITION 203
6.1 POINT, LINE AND AREA SENSORS 205
6.2 IMAGE TUBE CAMERAS 206
6.3 PHOTOMULTIPLIERS 206
6.3.1 IMAGE INTENSIFIERS 207
6.4 PHOTODIODES 207
6.5 POSITION SENSITIVE DETECTORS (PSD) 210
6.6 CHARGE-COUPLED DEVICE (CCD) 211
6.7 COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR (CMOS) SENSORS 213
6.8 LINE-SCAN CAMERAS 215
6.9 COLOR SENSORS AND COLOR CAMERAS 215
6.10 INFRARED CAMERAS 216
6.10.1 BOLOMETER CAMERAS 217
6.10.2 INFRARED QUANTUM DETECTOR CAMERAS 217
6.11 QUALITY CRITERIA FOR IMAGE SENSORS 219
6.12 BIBLIOGRAPHY 220
7 METHODS OF IMAGE ACQUISITION 223
7.1 INTRODUCTION 227
7.2 MEASURING OPTICAL PROPERTIES 228
7.2.1 MEASUREMENT OF THE COMPLEX INDEX OF REFRACTION 230
7.2.1.1 REFLECTOMETRY 230
7.2.1.2 ELLIPSOMETRY 234
7.2.2 FLUORESCENCE 240
7.2.3 METHODS FOR MEASURING THE REFLECTANCE 242
7.2.3.1 DIFFUSE ILLUMINATION 242
7.2.3.2 BRIGHT-FIELD ILLUMINATION 243
7.2.3.3 DARK-FIELD ILLUMINATION 244
7.2.3.4 LASER SCANNERS 246
7.2.3.5 FLATBED SCANNERS 248
XIV CONTENTS
7.2.4 SPECTRAL SENSORS 248
7.2.5 LIGHT SCATTERING METHODS AND THE INSPECTION OF SURFACE ROUGHNESS
.... 251
7.3 3D SHAPE CAPTURING 254
7.3.1 TRIANGULATION (POINT-BY-POINT SCANNING) 255
7.3.2 LIGHT-SECTION METHODS (LINE SCANNING) 259
7.3.3 THE MEASUREMENT UNCERTAINTY OF TRIANGULATION 260
7.3.4 STRUCTURED ILLUMINATION 263
7.3.4.1 STRIPE PROJECTION 264
7.3.5 DEFLECTOMETRY 268
7.3.5.1 OPEN RESEARCH QUESTIONS REGARDING DEFLECTOMETRY 276
7.3.6 THE MOIRE METHOD 276
7.3.6.1 THE MOIRE EFFECT 276
7.3.6.2 MATHEMATICAL MODEL OF THE MOIRE EFFECT 278
7.3.6.3 TELECENTRIC STRIPE PROJECTION 279
7.3.6.4 SHADOW MOIRE 283
7.3.6.5 PROJECTION MOIRE 284
7.3.7 FINAL REMARK ON STRUCTURED ILLUMINATION 285
7.3.8 STEREO IMAGES 285
7.3.8.1 DERIVATION OF THE FUNDAMENTAL MATRIX 286
7.3.8.2 STEREO CORRESPONDENCE ALGORITHMS 289
7.3.8.3 STEREO RECONSTRUCTION 290
7.3.8.4 MULTI-CAMERA SYSTEMS 290
7.3.8.5 MONOCULAR STEREO 291
7.3.9 LIGHT-FIELD CAMERAS 291
7.3.10 SILHOUETTE CAPTURING 296
7.3.10.1 TELECENTRIC SILHOUETTE CAPTURING 298
7.3.10.2 ILLUMINATION FOR TELECENTRIC IMAGING 298
7.3.10.3 RETROREFLECTORS 300
7.3.11 SHAPE FROM SHADING 301
7.3.12 AUTOFOCUS SENSORS 303
7.3.13 CONFOCAL MICROSCOPY 304
7.3.14 CONFOCAL CHROMATIC TRIANGULATION 307
7.3.15 TIME-OF-FLIGHT SENSORS 308
7.3.16 PHASE-BASED METHODS 309
7.3.16.1 INTERFEROMETRY 309
7.3.16.2 SPECKLE INTERFEROMETRY FOR MATERIAL INSPECTION 314
7.3.16.3 SHEAROGRAPHY 315
7.3.16.4 HOLOGRAPHY 317
7.4 CAPTURING INTERIOR OBJECT STRUCTURES 320
7.4.1 THERMOGRAPHY 321
7.4.2 IMAGING USING X-RAYS 325
7.4.3 OPTICAL COHERENCE TOMOGRAPHY 330
7.4.4 SCHLIEREN IMAGING AND SCHLIEREN TOMOGRAPHY 331
7.4.5 IMAGE ACQUISITION USING TERAHERTZ RADIATION 332
7.4.6 PHOTOELASTICITY 338
CONTENTS XV
7.5 SPECIAL IMAGE ACQUISITION METHODS 344
7.5.1 IMAGE ACQUISITION SYSTEMS WITH VARIABLE ILLUMINATION DIRECTION 348
7.5.2 ENDOSCOPY 349
7.6 UNIVERSAL PRINCIPLES 350
7.6.1 SUPPRESSION OF EXTRANEOUS LIGHT 350
7.6.2 INVERSE ILLUMINATION 351
7.7 SUMMARY 356
7.8 BIBLIOGRAPHY 358
II IMAGE PROCESSING 367
8 IMAGE SIGNALS 369
8.1 MATHEMATICAL MODEL OF IMAGE SIGNALS 373
8.2 SYSTEMS AND SIGNALS 374
8.2.1 SYSTEM CHARACTERISTICS 374
8.2.2 THE DIRAC DELTA FUNCTION 378
8.2.2.1 DEFINITION OF THE DIRAC DELTA FUNCTION 378
8.2.2.2 CHARACTERISTICS OF THE DIRAC DELTA FUNCTION 379
8.2.3 CONVOLUTION 381
8.3 THE FOURIER TRANSFORM 383
8.3.1 THE ONE-DIMENSIONAL FOURIER TRANSFORM 383
8.3.1.1 DEFINITION OF THE FOURIER TRANSFORM 383
8.3.1.2 PROPERTIES OF THE FOURIER TRANSFORM 384
8.3.1.3 FOURIER TRANSFORMS OF SELECTED FUNCTIONS 390
8.3.2 THE ONE-DIMENSIONAL SAMPLING THEOREM 393
8.3.3 THE DISCRETE FOURIER TRANSFORM (DFT) 396
8.3.3.1 DEFINITION OF THE DFT 396
8.3.3.2 PROPERTIES OF THE DFT 397
8.3.3.3 SPECTRAL LEAKAGE 398
8.3.3.4 THE FAST FOURIER TRANSFORM (FFT) 400
8.3.3.5 THE CONVOLUTION THEOREM OF THE DFT 401
8.3.4 THE TWO-DIMENSIONAL FOURIER TRANSFORM 401
8.3.4.1 DEFINITION OF THE TWO-DIMENSIONAL FOURIER TRANSFORM 401
8.3.4.2 PROPERTIES OF THE TWO-DIMENSIONAL FOURIER TRANSFORM 403
8.3.5 DIRAC DELTA FUNCTIONS IN TWO-DIMENSIONAL SPACE 407
8.3.6 THE TWO-DIMENSIONAL HEAVISIDE FUNCTION 409
8.3.7 SAMPLING OF TWO-DIMENSIONAL SIGNALS 409
8.3.8 SAMPLING THEOREM FOR TWO-DIMENSIONAL SIGNALS 413
8.3.9 THE TWO-DIMENSIONAL DFT 414
8.3.9.1 CALCULATION OF THE 2-D DFT IN PRACTICE 416
8.3.9.2 THE CONVOLUTION THEOREM OF THE 2-D DFT 417
8.3.9.3 THE MEANING OF MAGNITUDE AND PHASE 417
8.3.9.4 EXAMPLES OF THE TWO-DIMENSIONAL DFT 418
8.4 EXAMPLES OF USE CONCERNING SYSTEM THEORY AND THE FOURIER TRANSFORM
425
XVI
CONTENTS
8.5 IMAGE SIGNALS AS STOCHASTIC PROCESSES 432
8.5.1 MOMENTS OF STOCHASTIC PROCESSES 433
8.5.2 STATIONARITY AND ERGODICITY 436
8.5.3 PASSING A STOCHASTIC PROCESS THROUGH AN LSI SYSTEM 440
8.6 QUANTIZATION 445
8.6.1 OPTIMAL QUANTIZATION 446
8.6.2 THE QUANTIZATION THEOREM 448
8.6.3 MODELING OF THE QUANTIZATION 453
8.7 THE KARHUNEN-LOEVE TRANSFORM 455
8.7.1 DEFINITION OF THE KARHUNEN-LOEVE TRANSFORM 456
8.7.2 PROPERTIES OF THE KARHUNEN-LOEVE TRANSFORM 457
8.7.3 EXAMPLES OF APPLICATION OF THE KARHUNEN-LOEVE TRANSFORM 460
8.8 BIBLIOGRAPHY 464
9 PREPROCESSING AND IMAGE ENHANCEMENT 465
9.1 SIMPLE IMAGE ENHANCEMENT METHODS 467
9.1.1 CONTRAST ADJUSTMENT BY HISTOGRAM STRETCHING 467
9.1.2 HISTOGRAM MANIPULATION 469
9.1.3 PSEUDO-COLOR AND FALSE-COLOR IMAGES 472
9.1.3.1 PSEUDO-COLOR IMAGES 472
9.1.3.2 FALSE-COLOR IMAGES 473
9.1.4 IMAGE SHARPENING 474
9.2 REDUCTION OF SYSTEMATIC ERRORS 476
9.2.1 GEOMETRIC RECTIFICATION 476
9.2.1.1 BILINEAR INTERPOLATION 478
9.2.1.2 INTERPOLATION IN THE CONTEXT OF SYSTEM THEORY 479
9.2.2 SUPPRESSION OF INHOMOGENEITIES 480
9.2.2.1 SIGNAL MODEL 480
9.2.2.2 HOMOGENEITY 481
9.2.2.3 HOMOMORPHIC FILTERING 483
9.2.2.4 HOMOGENIZATION 485
9.3 ATTENUATION OF RANDOM DISTURBANCES 491
9.3.1 LINEAR FILTERS 491
9.3.1.1 LOW-PASS FILTERS FOR NOISE REDUCTION 496
9.3.1.2 MOVING AVERAGE FILTER 497
9.3.1.3 CONE LOW-PASS FILTER 500
9.3.1.4 GAUSSIAN LOW-PASS FILTER 500
9.3.1.5 IDEAL LOW-PASS FILTERS 505
9.3.1.6 CONSTRUCTING HIGH-PASS FILTERS, BAND-STOP FILTERS, AND BAND-PASS
FILTERS FROM A GIVEN LOW-PASS FILTER 506
9.3.1.7 EXCURSUS: THE Z-TRANSFORM 506
9.3.2 NOISE REDUCTION USING NONLINEAR FILTERS 509
9.3.2.1 THE MEDIAN FILTER 509
9.3.2.2 FILTERS BASED ON ORDER STATISTICS 513
9.3.2.3 BILATERAL FILTERS 514
CONTENTS XVII
9.4 IMAGE REGISTRATION 515
9.5 BIBLIOGRAPHY 518
10 IMAGE RESTORATION 521
10.1 SIGNAL MODEL 523
10.2 INVERSE FILTER 527
10.3 THE WIENER FILTER 533
10.4 THE GEOMETRIC MEAN FILTER 538
10.5 OPTIMAL CONSTRAINT FILTER 540
10.6 RESTORATION PROBLEMS IN MATRIX NOTATION 543
10.7 RESTORATION FOR PARTICIPATING MEDIA 546
10.8 SPATIALLY-VARYING IMAGE RESTORATION 548
10.9 BIBLIOGRAPHY 549
11 SEGMENTATION 553
11.1 REGION-BASED SEGMENTATION 556
11.1.1 SEGMENTATION BY FEATURE-BASED CLASSIFICATION 556
11.1.2 REGION GROWING METHODS 562
11.2 EDGE-ORIENTED METHODS 562
11.2.1 GRADIENT FILTERS 564
11.2.1.1 CONSTRUCTION OF SYMMETRIC LINEAR GRADIENT FILTERS 566
11.2.1.2 DIFFERENTIATION USING THE DFT 568
11.2.1.3 GRADIENT-OF-GAUSSIAN FILTER 570
11.2.1.4 SIMPLE EDGE OPERATORS 572
11.2.2 EDGE DETECTION USING THE SECOND DERIVATIVE 572
11.2.3 THE WATERSHED TRANSFORMATION 576
11.3 DIFFUSION FILTERS 578
11.3.1 LINEAR, HOMOGENEOUS, ISOTROPIC IMAGE DIFFUSION 579
11.3.2 LINEAR, INHOMOGENEOUS, ISOTROPIC IMAGE DIFFUSION 580
11.3.3 NONLINEAR, INHOMOGENEOUS, ISOTROPIC IMAGE DIFFUSION 581
11.3.4 NONLINEAR, INHOMOGENEOUS, ANISOTROPIC IMAGE DIFFUSION 581
11.4 ACTIVE CONTOURS 586
11.4.1 GRADIENT VECTOR FLOW 591
11.4.2 VECTOR FIELD CONVOLUTION 593
11.5 SEGMENTATION ACCORDING TO MUMFORD AND SHAH 594
11.6 SEGMENTATION USING GRAPH CUT METHODS 596
11.7 BIBLIOGRAPHY 604
12 MORPHOLOGICAL IMAGE PROCESSING 607
12.1 BINARY MORPHOLOGY 609
12.1.1 POINT SETS AND STRUCTURING ELEMENTS 609
12.1.2 EROSION AND DILATION 611
12.1.2.1 DUALITY OF EROSION AND DILATION 618
XVIII CONTENTS
12.1.3 OPENING AND CLOSING 620
12.1.4 BORDER EXTRACTION 623
12.1.5 REGION FILLING 624
12.1.6 COMPONENT LABELING AND CONNECTED COMPONENT ANALYSIS 624
12.1.7 THE HIT-OR-MISS OPERATOR 626
12.1.7.1 THINNING 627
12.1.7.2 THICKENING 629
12.1.8 SKELETONIZATION 630
12.1.9 PRUNING 632
12.2 GRAY-SCALE MORPHOLOGY 634
12.2.1 THE POINT SET OF A GRAY-SCALE IMAGE 634
12.2.2 EROSION AND DILATION 636
12.2.3 OPENING AND CLOSING 641
12.2.4 EDGE DETECTION 643
12.3 BIBLIOGRAPHY 645
13 TEXTURE ANALYSIS 649
13.1 TYPES OF TEXTURES 652
13.1.1 STRUCTURAL TEXTURE TYPE 653
13.1.2 STRUCTURAL-STATISTICAL TEXTURE TYPE 653
13.1.3 STATISTICAL TEXTURE TYPE 654
13.2 VISUAL INSPECTION TASKS REGARDING TEXTURES 655
13.3 MODEL-BASED TEXTURE ANALYSIS 656
13.3.1 ANALYSIS OF STRUCTURAL TEXTURES 656
13.3.2 ANALYSIS OF STRUCTURAL-STATISTICAL TEXTURES 660
13.3.3 AUTOREGRESSIVE MODELS FOR ANALYZING STATISTICAL TEXTURES 663
13.3.4 SEPARATION OF LINE TEXTURES 666
13.4 FEATURE-BASED TEXTURE ANALYSIS 671
13.4.1 BASIC STATISTICAL TEXTURE FEATURES 672
13.4.2 CO-OCCURRENCE MATRIX 673
13.4.3 HISTOGRAM OF ORIENTED GRADIENTS 676
13.4.4 RUN-LENGTH ANALYSIS 677
13.4.5 LAWS TEXTURE ENERGY MEASURES 678
13.4.6 LOCAL BINARY PATTERNS 680
13.5 BIBLIOGRAPHY 681
14 DETECTION 685
14.1 DETECTION OF KNOWN OBJECTS BY LINEAR FILTERS 688
14.1.1 UNKNOWN BACKGROUND 688
14.1.2 WHITE NOISE AS BACKGROUND 690
14.1.3 CORRELATED, WEAKLY STATIONARY NOISE AS BACKGROUND 692
14.1.4 DISCRETE FORMULATION OF THE MATCHED FILTER 693
14.2 DETECTION OF UNKNOWN OBJECTS (DEFECTS) 697
CONTENTS XIX
14.3 DETECTION OF STRAIGHT LINES 699
14.3.1 THE RADON TRANSFORM 699
14.3.1.1 DEFINITION 699
14.3.1.2 THE FOURIER SLICE THEOREM 702
14.3.1.3 EFFICIENT COMPUTATION OF THE RADON TRANSFORM 703
14.3.2 DETECTION OF LINE-SHAPED STRUCTURES 706
14.3.2.1 SIGNAL-TO-NOISE RATIO (SNR) 706
14.3.2.2 DETECTION USING CORRELATION FILTERS 707
14.3.2.3 EXAMPLES OF APPLICATIONS 707
14.3.3 THE HOUGH TRANSFORM FOR THE DETECTION OF LINES 710
14.3.4 THE HOUGH TRANSFORM FOR THE DETECTION OF CURVES 711
14.3.5 THE GENERALIZED HOUGH TRANSFORM 714
14.3.6 IMPLICIT SHAPE MODELS 715
14.4 CORNER DETECTION 715
14.5 BIBLIOGRAPHY 717
15 IMAGE PYRAMIDS, THE WAVELET TRANSFORM AND MULTIRESOLUTION ANALYSIS
721
15.1 IMAGE PYRAMIDS 723
15.1.1 GAUSSIAN PYRAMID 725
15.1.2 LAPLACIAN PYRAMID 726
15.1.3 PYRAMID LINKING 727
15.2 WAVELETS 728
15.2.1 CONTINUOUS WAVELET TRANSFORM 728
15.2.2 DISCRETIZATION OF THE WAVELET TRANSFORM 731
15.3 MULTIRESOLUTION ANALYSIS 733
15.4 THE FAST WAVELET TRANSFORM 738
15.5 THE TWO-DIMENSIONAL WAVELET TRANSFORM 742
15.6 SCALE-INVARIANT FEATURES 744
15.7 BIBLIOGRAPHY 749
III APPENDIX 751
A MATHEMATICAL FOUNDATIONS 753
A.1 THE INTERCEPT THEOREM 755
A.2 INVERSE PROBLEMS 756
A.3 BIBLIOGRAPHY 757
B THE FOURIER TRANSFORM 759
B.1 THE ONE-DIMENSIONAL FOURIER TRANSFORM 761
B.1.1 DEFINITION 761
B.1.2 PROPERTIES AND CHARACTERISTICS 762
B.1.3 CORRESPONDENCES 763
XX CONTENTS
B.2 THE
TI
-DIMENSIONAL FOURIER TRANSFORM 765
B.2.1 DEFINITION 765
B.2.2 CORRESPONDENCES OF THE TWO-DIMENSIONAL FOURIER TRANSFORM 765
B.3 THE DISCRETE FOURIER TRANSFORM 766
LIST OF SYMBOLS 769
LIST OF ABBREVIATIONS 785
INDEX 789
|
| any_adam_object | 1 |
| author | Beyerer, Jürgen 1961- Puente León, Fernando 1969-2020 Frese, Christian 1972- |
| author_GND | (DE-588)114116733 (DE-588)143524291 (DE-588)130396087 |
| author_facet | Beyerer, Jürgen 1961- Puente León, Fernando 1969-2020 Frese, Christian 1972- |
| author_role | aut aut aut |
| author_sort | Beyerer, Jürgen 1961- |
| author_variant | j b jb l f p lf lfp c f cf |
| building | Verbundindex |
| bvnumber | BV043177070 |
| ctrlnum | (OCoLC)910739334 (DE-599)DNB1071728458 |
| dewey-full | 006.37 621.3 |
| dewey-hundreds | 000 - Computer science, information, general works 600 - Technology (Applied sciences) |
| dewey-ones | 006 - Special computer methods 621 - Applied physics |
| dewey-raw | 006.37 621.3 |
| dewey-search | 006.37 621.3 |
| dewey-sort | 16.37 |
| dewey-tens | 000 - Computer science, information, general works 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV043177070 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:30:29Z |
| institution | BVB |
| isbn | 9783662477939 3662477939 9783662477946 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028601121 |
| oclc_num | 910739334 |
| open_access_boolean | |
| owner | DE-92 |
| owner_facet | DE-92 |
| physical | XX, 798 S. 235 mm x 155 mm |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Springer |
| record_format | marc |
| spellingShingle | Beyerer, Jürgen 1961- Puente León, Fernando 1969-2020 Frese, Christian 1972- Machine vision automated visual inspection: theory, practice and applications Automatisches Prüfen (DE-588)4269925-3 gnd Visuelle Prüfung (DE-588)4188426-7 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Bildverarbeitung (DE-588)4006684-8 gnd |
| subject_GND | (DE-588)4269925-3 (DE-588)4188426-7 (DE-588)4129594-8 (DE-588)4006684-8 |
| title | Machine vision automated visual inspection: theory, practice and applications |
| title_auth | Machine vision automated visual inspection: theory, practice and applications |
| title_exact_search | Machine vision automated visual inspection: theory, practice and applications |
| title_full | Machine vision automated visual inspection: theory, practice and applications Jürgen Beyerer ; Fernando Puente León ; Christian Frese |
| title_fullStr | Machine vision automated visual inspection: theory, practice and applications Jürgen Beyerer ; Fernando Puente León ; Christian Frese |
| title_full_unstemmed | Machine vision automated visual inspection: theory, practice and applications Jürgen Beyerer ; Fernando Puente León ; Christian Frese |
| title_short | Machine vision |
| title_sort | machine vision automated visual inspection theory practice and applications |
| title_sub | automated visual inspection: theory, practice and applications |
| topic | Automatisches Prüfen (DE-588)4269925-3 gnd Visuelle Prüfung (DE-588)4188426-7 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Bildverarbeitung (DE-588)4006684-8 gnd |
| topic_facet | Automatisches Prüfen Visuelle Prüfung Maschinelles Sehen Bildverarbeitung |
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| work_keys_str_mv | AT beyererjurgen machinevisionautomatedvisualinspectiontheorypracticeandapplications AT puenteleonfernando machinevisionautomatedvisualinspectiontheorypracticeandapplications AT fresechristian machinevisionautomatedvisualinspectiontheorypracticeandapplications |