Saved in:
| Title: | Electromigration in ULSI interconnections |
|---|---|
| From: |
Cher Ming Tan
|
| Person: |
Tan, Cher Ming
1959- Verfasser aut |
| Main Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hackensack, N.J.
World Scientific
c2010
|
| Series: | International series on advances in solid state electronics and technology
|
| Subjects: | |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | xix, 291 p. |
| ISBN: | 9814273325 9789814273329 9789814273336 |
Staff View
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Record in the Search Index
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| author | Tan, Cher Ming 1959- |
| author_facet | Tan, Cher Ming 1959- |
| author_role | aut |
| author_sort | Tan, Cher Ming 1959- |
| author_variant | c m t cm cmt |
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| bvnumber | BV044156277 |
| collection | ZDB-30-PAD |
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| dewey-full | 621.3815284 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815284 |
| dewey-search | 621.3815284 |
| dewey-sort | 3621.3815284 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044156277 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:55:31Z |
| institution | BVB |
| isbn | 9814273325 9789814273329 9789814273336 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029563122 |
| oclc_num | 714877548 |
| open_access_boolean | |
| physical | xix, 291 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | World Scientific |
| record_format | marc |
| series2 | International series on advances in solid state electronics and technology |
| spelling | Tan, Cher Ming 1959- Verfasser aut Electromigration in ULSI interconnections Cher Ming Tan Hackensack, N.J. World Scientific c2010 xix, 291 p. txt rdacontent c rdamedia cr rdacarrier International series on advances in solid state electronics and technology Includes bibliographical references and index Integrated circuits Ultra large scale integration Electrodiffusion |
| spellingShingle | Tan, Cher Ming 1959- Electromigration in ULSI interconnections Integrated circuits Ultra large scale integration Electrodiffusion |
| title | Electromigration in ULSI interconnections |
| title_auth | Electromigration in ULSI interconnections |
| title_exact_search | Electromigration in ULSI interconnections |
| title_full | Electromigration in ULSI interconnections Cher Ming Tan |
| title_fullStr | Electromigration in ULSI interconnections Cher Ming Tan |
| title_full_unstemmed | Electromigration in ULSI interconnections Cher Ming Tan |
| title_short | Electromigration in ULSI interconnections |
| title_sort | electromigration in ulsi interconnections |
| topic | Integrated circuits Ultra large scale integration Electrodiffusion |
| topic_facet | Integrated circuits Ultra large scale integration Electrodiffusion |
| work_keys_str_mv | AT tancherming electromigrationinulsiinterconnections |