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Bibliographic Details
Title:Scanning electron microscopy and x-ray microanalysis
From: Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
Person: Goldstein, Joseph
1939-2015
aut
Newbury, Dale E.
Michael, Joseph R.
Ritchie, Nicholas W. M.
Scott, John Henry J.
Joy, David C.
1943-
Main Authors: Goldstein, Joseph 1939-2015 (Author), Newbury, Dale E. (Author), Michael, Joseph R. (Author), Ritchie, Nicholas W. M. (Author), Scott, John Henry J. (Author), Joy, David C. 1943- (Author)
Format: Book
Language:English
Published: New York, NY Springer [2018]
Edition:Fourth edition
Subjects:
Physical Description:XXIII, 550 Seiten Illustrationen, Diagramme (teilweise farbig)
ISBN:9781493966745

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